A general imperfect-software-debugging model with S-shaped fault-detection rateHOANG PHAM; NORDMANN, L; XUEMEI ZHANG et al.IEEE transactions on reliability. 1999, Vol 48, Num 2, pp 169-175, issn 0018-9529Article

Calculation of frequency, duration, and availability indexes in complex networksBILLINTOR, R; JONNAVITHULA, S.IEEE transactions on reliability. 1999, Vol 48, Num 1, pp 25-30, issn 0018-9529Article

Distributed-program reliability analysis : Complexity and efficient algorithmsLIN, M. S; CHANG, M. S; CHEN, D. J et al.IEEE transactions on reliability. 1999, Vol 48, Num 1, pp 87-95, issn 0018-9529Article

Mean residual life of lifetime distributionsTANG, L. C; LU, Y; CHEW, E. P et al.IEEE transactions on reliability. 1999, Vol 48, Num 1, pp 73-78, issn 0018-9529Article

The small appliance and computer industry : Do they forget reliability lessons ?KATZ, A.IEEE transactions on reliability. 1999, Vol 48, Num 1, pp 4-5, issn 0018-9529Article

A fast reliability-algorithm for the circular consecutive-weighted-k-out-of-n :F systemCHANG, J.-C; CHEN, R.-J; HWANG, F. K et al.IEEE transactions on reliability. 1998, Vol 47, Num 4, pp 472-474, issn 0018-9529Article

A revised layered-network algorithm to search for all d-Minpaths of a limited-flow acyclic networkYEH, W.-C.IEEE transactions on reliability. 1998, Vol 47, Num 4, pp 436-442, issn 0018-9529Article

An improved algorithm for coherent-system reliabilityTONG LUO; TRIVEDI, K. S.IEEE transactions on reliability. 1998, Vol 47, Num 1, pp 73-78, issn 0018-9529Article

DIRSMIN: A fault-tolerant switch for B-ISDN applications using dilated reduced-stage MINSOMANI, A. K; TIANMING ZHANG.IEEE transactions on reliability. 1998, Vol 47, Num 1, pp 19-29, issn 0018-9529Article

Evolution of component-qualification methods for local component-manufacturers for telecom applicationsSETTUR, S; MANOJ KUMAR, A. K; LAKSHMI, Y. V. S et al.IEEE transactions on reliability. 1998, Vol 47, Num 3, pp 346-354, issn 0018-9529, 2Article

Minimax approach to accelerated life testsGINEBRA, J; SEN, A.IEEE transactions on reliability. 1998, Vol 47, Num 3, pp 261-267, issn 0018-9529, 1Article

Module replication for fault-tolerant real-time distributed systemsVARVARIGOU, T. A; TROTTER, J.IEEE transactions on reliability. 1998, Vol 47, Num 1, pp 8-18, issn 0018-9529Article

Optimal allocation of interchangeable components in a series-parallel systemRAJENDRA PRASAD, V; RAGHAVACHARI, M.IEEE transactions on reliability. 1998, Vol 47, Num 3, pp 255-260, issn 0018-9529, 1Article

Parameter estimation for the 3-parameter Gamma distribution using the continuation methodHIROSE, H.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 188-196, issn 0018-9529Article

Pitfalls of Accelerated testingMEEKER, W. Q; ESCOBAR, L. A.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 114-118, issn 0018-9529Article

Redundancy optimization for series-parallel multi-state systemsLEVITIN, G; LISNIANSKI, A; BEN-HAIM, H et al.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 165-172, issn 0018-9529Article

Reliability life-testing and failure-analysis of GaAs monolithic Ku-band driver amplifiersMITTEREDER, J. A; ROUSSOS, J. A; CHRISTIANSON, K. A et al.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 119-125, issn 0018-9529Article

Some statistical characteristics of a repairable, standby, human & machine systemSRIDHARAN, V; MOHANAVADIVU, P.IEEE transactions on reliability. 1998, Vol 47, Num 4, pp 431-435, issn 0018-9529Article

Testing exponentiality of the residual life, based on dynamic Kullback-Leibler informationEBRAHIMI, N.IEEE transactions on reliability. 1998, Vol 47, Num 2, pp 197-201, issn 0018-9529Article

Analysis of repair algorithms for mirrored-disk systemsKARI, H. H; SAIKKONEN, H. K; PARK, N et al.IEEE transactions on reliability. 1997, Vol 46, Num 2, pp 193-200, issn 0018-9529Article

Bayes inference for S-shaped software-reliability growth modelsKUO, L; JAE CHANG LEE; CHOI, K et al.IEEE transactions on reliability. 1997, Vol 46, Num 1, pp 76-80, issn 0018-9529Article

Comparing cumulative incidence functions of a competing-risks modelSUN, Y; TIWARI, R. C.IEEE transactions on reliability. 1997, Vol 46, Num 2, pp 247-253, issn 0018-9529Article

Electrochemical impedance spectroscopic study of encapsulated triple tracks test (TTT) circuitsMADANI, M. M; KODNANI, R. R; GRANATA, R. D et al.IEEE transactions on reliability. 1997, Vol 46, Num 1, pp 45-51, issn 0018-9529, 55 [8 p.]Article

Statistical analysis of a power-law model for repair dataPARK, W. J; PICKERING, E. H.IEEE transactions on reliability. 1997, Vol 46, Num 1, pp 27-30, issn 0018-9529Article

A variance-reduction technique via fault-expansion for fault-coverage estimationSMITH, D. T; JOHNSON, B. W; ANDRIANOS, N et al.IEEE transactions on reliability. 1997, Vol 46, Num 3, pp 366-374, issn 0018-9529Article